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 | Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Chapter 1: Nanoscale Characterization |
| | In-situ Gas Injection-Heating Atomic Resolution TEM for Nanomaterials | | Authors: | X.F. Zhang | | Affilation: | Hitachi High Technologies America, Inc., US | | Pages: | 89 - 92 | | Keywords: | in-situ gas-heating TEM, nanomaterials | | Abstract: | In-situ gas environmental transmission electron microscopy (TEM) capability has been developed based on a Hitachi 300 kV high-resolution transmission electron microscope (H-9500) combined with a Hitachi gas injection-heating sample holder. This simple but high performance system allows for dynamic observation and chemical analysis of nanomaterials in-situ, at elevated temperatures with gas environment, and most importantly at atomic resolution. Experimental high-resolution images for in-situ oxidation of Si and SnO2 crystal growth are presented. Various nanomaterials were studied to reveal their structural response at high temperatures under gaseous conditions. For example, coalescence of Pt catalysts at 800oC in an air environment was studied. Oxidation-reduction and phase transformation of metallic or semiconducting nanoparticles and nanowires are main focuses in the researches under going. The development of this atomic resolution, in-situ gas-heating TEM system offers an affordable platform for a broad range of user facilities in academic as well as in industry fields to perform gas-solid interaction studies to gain new insights into fundamental behaviors of nanomaterials on an atomic level. The researches will have a great impact on nanoscience and nanotechnology associated with catalysts, fuel cells, environmental safety, gas sensors, geochemistry, and toxicity. | | ISBN: | 1-4200-6376-6 |
| Pages: | 768 |
| Hardcopy: | $199.99 |
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