Nanotech 2007 Vol. 4
Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4

Nanoscale Characterization Chapter 1

The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis

Authors: D.H.W. Hubert, B. Freitag and D.J. Stokes

Affilation: FEI Company, Netherlands

Pages: 85 - 88

Keywords: aberration corrector, monochromator, single atoms, sub-angstrom resolution, spectroscopy

As the limits of nanotechnology are expanded ever further, so too must we push back the frontiers of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the development of electron microscopy and spectroscopy to the extremes of performance. For example, aberration-corrected S/TEM gives us the ability to work at sub-angstrom length-scales. This, combined with sharply-defined energy resolution, enables us to acquire information at the single atomic level and gain knowledge of inter-atomic bonding for characterisation of chemical composition, electronic structure and mechanical properties. In addition, there is scope for capturing time-resolved structural transformations with sub-nanometer detail, enabling us to directly observe and understand the dynamics of a range of chemical processes in situ. We discuss the advances that have enabled these technological breakthroughs and demonstrate the potential for new insights in nano-characterisation and analysis.

The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis

ISBN: 1-4200-6376-6
Pages: 768
Hardcopy: $139.95