Nano Science and Technology Institute
Nanotech 2007 Vol. 4
Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
 
Chapter 1: Nanoscale Characterization
 

Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materials

Authors:U. Schmidt, F. Vargas, M. Kress, T. Dieing, K. Weishaupt and O. Hollricher
Affilation:WITec GmbH, DE
Pages:48 - 51
Keywords:confocal, Raman, AFM, imaging
Abstract:The Confocal Raman-AFM is a breakthrough in microscopy. It combines three measuring techniques in one instrument: a high resolution confocal optical microscope, an extremely sensitive Raman spectroscopy system, and an Atomic Force Microscope (AFM). Using this instrument, the high spatial and topographical resolution obtained with an AFM can be directly linked to the chemical information provided by confocal Raman spectroscopy. By simply rotating the microscope turret, the AFM is transformed into a confocal Raman microscope. With the confocal Raman microscope, it is possible to obtain Raman spectra from extremely small sample volumes and to collect high resolution Raman spectral images.
Confocal Raman AFM, a powerful tool for the nondestructive characterization of heterogeneous materialsView PDF of paper
ISBN:1-4200-6376-6
Pages:768
Hardcopy:$139.95
 
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