Nano Science and Technology Institute
Nanotech 2007 Vol. 4
Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Chapter 1: Nanoscale Characterization

Determination of micro-structural properties with x-ray absorption fine structure

Authors:S.-W. Han, S.-H. Park, H.-J. Yu, E.-S. Jeong, S.-H. Kim, Y.-J. Kim and G.-C. Yi
Affilation:Chonbuk National University, KR
Pages:9 - 12
Keywords:XAFS, structures, disorder, nanoparticle, ZnO, nanorod
Abstract:We studied the structural properties of ZnO nanostructures with x-ray absorption fine structure (XAFS) to understand the growth mechanism of vertically aligned ZnO nanorods of the average diameter of 50 - 150 nm. The orientation-dependent XAFS measurements parallel and perpendicular to the c-axis of ZnO nanorods with lengths of 0.1, 0.2 and 1.0 microns showed different amount of disorder existing in the bond lengths. The disorder in ab-plane was greatly reduced, as the ZnO formed into nanorods. We also demonstrate that the lateral surface of the ZnO nanorods have oxygen-termination determined by the XAFS analysis.
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