 | Nanotech 2007 Vol. 4
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Chapter 1: Nanoscale Characterization |
3D structure of nano-scale materials by total x-ray scattering | |
| Authors: | V. Petkov |
| Affilation: | Central Michigan University, US |
| Pages: | 5 - 8 |
| Keywords: | total x-ray scattering, 3D atomic-scale structure |
| Abstract: | Knowledge about the three-dimensional (3D) structure, including the type and positions of atomic/molecular units in space, is an important prerequisite to understanding, predicting and improving properties of materials. With common materials it is routinely obtained by Bragg x-ray diffraction. With materials structured at the nano-scale, however, traditional x-ray crystallography fails because of the very limited length of structural coherence they show. We will present a non-traditional approach involving total (Bragg and diffuse) x-ray scattering and atomic Pair Distribution Function analysis for determining the 3D structure of nano-scale materials with atomic resolution. The great potential of the approach will be illustrated with examples from recent studies on nanoparticles [1], nanocomposites [2], nanotubes [3], nanoceramics [4], polymeric templates [5] and others. 1. V. Petkov et al. Phys. Rev. B 72 (2005) 195402. 2. V. Petkov at al. J. Am. Chem. Soc. 127 (2005) 8805. 3. V. Petkov at al. Phys. Rev. B 69. (2004) 085410. 4. V. Petkov et al. Chem. Mater,.18 (2006) 814. 5. V. Petkov et al. Solid State Comm. 134 (2005) 671. |
| ISBN: | 1-4200-6376-6 |
| Pages: | 768 |
| Hardcopy: | $139.95 |
| Order: | Mail/Fax Form |
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