Non-standard geometry scaling effects

	Nanotech 2007 Vol. 3 Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3 Chapter 7: Compact Modeling
	Non-standard geometry scaling effects
Authors:	M. Schröter and S. Lehmann
Affilation:	Technische Universität Dresden, DE
Pages:	603 - 608
Keywords:	non-standard, geometry scaling, compact model, physics-based
Abstract:	The impact of process and geometry effects on important electrical parameters of SiGe HBTs as a function of emitter width is investigated and explained using device and circuit simulations. The goal is to provide a guideline for identifying such effects, especially those causing non-standard geometry scaling, in order to be able to include them in the parameter extraction for geometry scalable physics-based compact models. Simple extensions of the standard scaling law are suggested, which are suitable for compact modeling. Experimental results exhibting some of the effects will be shown as demonstration.
ISBN:	1-4200-6184-4
Pages:	732
Hardcopy:	$139.95

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