Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 3
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3

Compact Modeling Chapter 7

Non-standard geometry scaling effects

Authors: M. Schröter and S. Lehmann

Affilation: Technische Universität Dresden, Germany

Pages: 603 - 608

Keywords: non-standard, geometry scaling, compact model, physics-based

The impact of process and geometry effects on important electrical parameters of SiGe HBTs as a function of emitter width is investigated and explained using device and circuit simulations. The goal is to provide a guideline for identifying such effects, especially those causing non-standard geometry scaling, in order to be able to include them in the parameter extraction for geometry scalable physics-based compact models. Simple extensions of the standard scaling law are suggested, which are suitable for compact modeling. Experimental results exhibting some of the effects will be shown as demonstration.

Non-standard geometry scaling effects

ISBN: 1-4200-6184-4
Pages: 732
Hardcopy: $139.95