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Nanotech 2007 Vol. 3
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Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
Nanotech 2007 Vol. 3
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 7: Compact Modeling
 

A Computationally Efficient Method for Evaluating Distortion in DG MOSFETs

Authors:R. Salazar, A. Ortiz-Conde and F.J. García Sánchez
Affilation:Solid State Electronics Laboratory, VE
Pages:582 - 585
Keywords:double gate MOSFET, independently driven, distortion
Abstract:In this paper we have generalized the correlation between Integral Nonlinearity Function (INLF) and Total Harmonic Distortion (THD) of independently driven double -gate (IDDG) MOSFETs.
ISBN:1-4200-6184-4
Pages:732
Hardcopy:$199.99
 
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