Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 3
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 3

Sensors & MEMS Chapter 3

Design of Radiation Tolerant Readout System for an Integrated SRAM Based Neutron Detector

Authors: P. Malinowski, D. Makowski, G. Jablonski and A. Napieralski

Affilation: Technical University of Lodz, Poland

Pages: 248 - 251

Keywords: single event effect, single event upset, Hamming codes, cyclic redundancy check, state machine, static random access memory, neutron radiation, nanotechnology, microelectronics

Abstract:
This paper presents a design of a radiation tolerant readout system for an SRAM-based neutron detector. The radiation tolerance has been achieved on the system level by applying Error Detection and Correction schemes. The constructed system concerns using state machines immune to Single Event Upsets induced by neutron radiation.

Design of Radiation Tolerant Readout System for an Integrated SRAM Based Neutron Detector

ISBN: 1-4200-6184-4
Pages: 732
Hardcopy: $139.95