Nano Science and Technology Institute
Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 1
Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 1
Chapter 5: Nanostructured Materials and Devices

Current-induced Breakdown of Carbon Nanofibers Under Vacuum and Atmospheric Conditions

Authors:H. Kitsuki, Q. Ngo, M. Suzuki, K. Gleason, P. Wilhite, A.M. Cassell, C.R. Moylan, J. Li and C.Y. Yang
Affilation:Santa Clara University, US
Pages:384 - 387
Keywords:carbon nanofibers, current-induced breakdown, scanning transmission electron microscopy (STEM), thermal transport
Abstract:Current-induced breakdown phenomena of carbon nanofibers (CNFs) for the development of carbon-based interconnects are investigated to reveal current-carrying capacity and reliability of CNF devices. Scanning transmission electron microscopy (STEM) techniques are developed to study the structural damage by current stress, including in-situ electrical measurement in STEM. The correlation between maximum current density and electrical resistivity confirms the importance of local Joule heating, showing strong coupling between electrical and thermal transport in CNFs.
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