Authors: J.M Miller, G.J. Kearns and J.E. Hutchison
Affilation: Dune Sciences, LLC, United States
Pages: 305 - 308
Keywords: imaging, surface science, structure-property relationships, nanomaterials
Excitement about nanotechnology derives from unique size/structure dependent properties of nanoscale materials. Methods to prepare a wide range of structures are now available, but a limited fundamental understanding of structure-function relationships remains a significant challenge for the design of useful new nanoscale materials, assemblies, and devices. In order to address this challenge, improved characterization platforms that can provide much richer information in terms of direct correlation of these relationships are required. In this paper, we present a revolutionary new window of opportunity for nanostructure visualization and characterization. This new platform/TEM grid developed at the University of Oregon allows for the direct non-destructive imaging and characterization of a wide range of new nanomaterials and structures. Key properties of these grids include excellent chemical and physical stability/compatibility, rigidity of wafer to resist bending or deforming, uniformity and planarity of surface, and outstanding high-resolution imaging. Unlike other TEM grids, the well-defined surface of thermal SiO2 windows allows for a wide range of surface modification to promote specific and non-specific interaction of the sample with the grid. These characteristics allow one to measure the electronic, optical, chemical, and biological properties of samples in addition to imaging using the same sample.