Nano Science and Technology Institute
Nanotech 2006 Vol. 3
Nanotech 2006 Vol. 3
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 7: Compact Modeling
 

High-Voltage LDMOS Compact Modeling

Authors:M.B. Willemsen, R. van Langevelde and D.B.M. Klaassen
Affilation:Philips Research, NL
Pages:714 - 719
Keywords:LDMOS, high-voltage, compact modeling
Abstract:In compact modeling of high-voltage LDMOS devices often a sub-circuit approach is used. While for the channel region a standard compact MOS model (for example BSIM4, MM11 or PSP) is used, the drift region is described by a compact JFET model. We will show that using this conventional approach
the effects of the widening of the depletion region in the lateral direction can not be taken into account properly.
As a consequence the voltage at the internal node between channel and drift region becomes unphysical and accurate
physics-based capacitance modeling becomes unfeasible.
 
In this paper we will introduce a new approach for compact LDMOS modeling to remedy these shortcomings. Next we describe the method to implement this approach in a circuit simulator. Finally a comparison of measurements and simulations is presented for both currents and capacitances.
High-Voltage LDMOS Compact ModelingView PDF of paper
ISBN:0-9767985-8-1
Pages:913
Hardcopy:$119.95
 
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