A transient circuit model for a phase change memory element

	Nanotech 2006 Vol. 3 Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3 Chapter 7: Compact Modeling
	A transient circuit model for a phase change memory element
Authors:	H.G.A. Huizing, D. Tio Castro, J.C.J. Paasschens and M.H.R. Lankhorst
Affilation:	Philips, NL
Pages:	860 - 863
Keywords:	lumped element model phase change memory
Abstract:	A transient lumped element model for a phase change memory (PCM) cell is developed for use in a circuit simulator. Unlike existing models, this model calculates threshold voltage and off-state resistance drift as found in PCM-cells. After an explanation of the model, simulations results are shown and compared with measurements.
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ISBN:	0-9767985-8-1
Pages:	913
Hardcopy:	$119.95

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