![]() | Nanotech 2006 Vol. 3
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 7: Compact Modeling |
On Idlow with Emphasis on Speculative SPICE Modeling | |
| Authors: | Q. Chen, Z-Y Wu, A.B. Icel, J-S Goo, S. Krishnan, C. Thuruthiyil, N. Subba, S. Suryagandh, J.X. An, T. Ly, M. Radwin, J. Yonemura and F. Assad |
| Affilation: | Advanced Micro Devices, US |
| Pages: | 831 - 834 |
| Keywords: | alpha-power law model, Idlow, SPICE, compact model |
| Abstract: | An empirical correlation model of Idlow, the MOSFET drain current measured at Vgs=Vdd/2 and Vds=Vdd, where Vdd is the supply voltage, is proposed based on the alpha-power law model. It enables a comprehensive analysis of Idlow over a wide range of device geometry, supply voltage, and temperature in multi-threshold-voltage technologies. Built upon and verified by electrical-test data of 90nm partially-depleted (PD) silicon-on-insulator (SOI) technologies, the newly developed methodology provides practical and efficient guidelines to device target projection and target-based speculative SPICE model extraction. |
![]() | View PDF of paper |
| ISBN: | 0-9767985-8-1 |
| Pages: | 913 |
| Hardcopy: | $119.95 |
| Order: | Mail/Fax Form |
| Special: | 3 CD Set — 15% off with Free Shipping |
| Up |







