Thermal Noise and Bit Error Rate Limits in Nanoscale Memories

	Nanotech 2006 Vol. 3 Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3 Chapter 1: Nano and Molecular Electronics and Photonics
	Thermal Noise and Bit Error Rate Limits in Nanoscale Memories
Authors:	L. Forbes, M. Mudrow and W. Wanalertlak
Affilation:	oregon state university, US
Pages:	78 - 81
Keywords:	noise, error rates, nanoscale memories
Abstract:	Analysis of the effects of thermal noise in nanoscale memories is presented. A theoretical analysis of thermal noise is used to predict the number of bit errors per year caused by thermal noise.
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ISBN:	0-9767985-8-1
Pages:	913
Hardcopy:	$119.95

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