Nano Science and Technology Institute
Nanotech 2006 Vol. 3
Nanotech 2006 Vol. 3
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 1: Nano and Molecular Electronics and Photonics
 

Thermal Noise and Bit Error Rate Limits in Nanoscale Memories

Authors:L. Forbes, M. Mudrow and W. Wanalertlak
Affilation:oregon state university, US
Pages:78 - 81
Keywords:noise, error rates, nanoscale memories
Abstract:Analysis of the effects of thermal noise in nanoscale memories is presented. A theoretical analysis of thermal noise is used to predict the number of bit errors per year caused by thermal noise.
Thermal Noise and Bit Error Rate Limits in Nanoscale MemoriesView PDF of paper
ISBN:0-9767985-8-1
Pages:913
Hardcopy:$119.95
 
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