Nanotech 2006 Vol. 3
Nanotech 2006 Vol. 3
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3

Nano and Molecular Electronics and Photonics Chapter 1

Thermal Noise and Bit Error Rate Limits in Nanoscale Memories

Authors: L. Forbes, M. Mudrow and W. Wanalertlak

Affilation: oregon state university, United States

Pages: 78 - 81

Keywords: noise, error rates, nanoscale memories

Abstract:
Analysis of the effects of thermal noise in nanoscale memories is presented. A theoretical analysis of thermal noise is used to predict the number of bit errors per year caused by thermal noise.

Thermal Noise and Bit Error Rate Limits in Nanoscale Memories

ISBN: 0-9767985-8-1
Pages: 913
Hardcopy: $119.95