Nano Science and Technology Institute
Nanotech 2006 Vol. 3
Nanotech 2006 Vol. 3
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 1: Nano and Molecular Electronics and Photonics
 

Numerical Modeling of Nanoscale Silicon Photodetectors that Use Electromagnetic Resonance Modes to Enhance Performance

Authors:D. Crouse and P. Keshavareddy
Affilation:The City College of New York, US
Pages:106 - 109
Keywords:silicon, photodetectors, surface plasmons, numerical modeling, optical communications
Abstract:Several high responsivity, high bandwidth, low bit error ratio (BER) nanoscale Si photodetectors are modeled including metal-semiconductor-metal photodetectors (MSM-PD), MSM-PDs fabricated on silicon-on-insulator substrates, and avalanche photodiodes. The authors have analyzed surface plasmons and other electromagnetic resonance modes (ER) and OM modes including Wood-Rayleigh anomalies and diffraction in structures with nanometer-sized features and have found that the use of combinations of these modes can perform light channeling and light localization that can be applied to the development of photodetectors. In this work, the ERs and OMs within the nanoscale Si photodetecting structures are modeled, all aspects of electron and hole generation, recombination, drift and multiplication are calculated, eye diagrams are constructed, and the maximum bandwidth, responsivity, quality factor and BER are calculated given a 256 bit non-return to zero pseudo-random bit sequence optical signal. Comparisons of these photodetectors, performance characteristics of each one, and applications of these devices are discussed.
Numerical Modeling of Nanoscale Silicon Photodetectors that Use Electromagnetic Resonance Modes to Enhance PerformanceView PDF of paper
ISBN:0-9767985-8-1
Pages:913
Hardcopy:$119.95
 
Order:Mail/Fax Form
Up
© 2014 Nano Science and Technology Institute. All Rights Reserved.
Terms of Use | Privacy Policy | Contact Us | Site Map