Nano Science and Technology Institute
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 1
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
 
Chapter 8: Characterization
 

Comparison between Nanoindentation and Scratch Test Hardness (Scratch Hardness) Values of Copper Thin Films on Oxidised Silicon Substrates

Authors:S. Chowdhury, D. Beegan and M.T. Laugier
Affilation:University of Alabama at Birmingham, US
Pages:775 - 776
Keywords:scratch hardness, nanoindentation, copper
Abstract:We have measured hardness i.e. scratch hardness from the scratch tester usually used for investigating adhesion in thin films and compare this with hardness measured by the nanoindentation technique on copper thin films. We defined scratch hardness as the load per unit load-bearing area during scratching, calculated from applied load and the width of the scratch obtained after the test is completed. Copper films with different thickness range (100 nm to 500 nm) have been deposited by rf magnetron sputtering on silicon substrate. Scratch hardness was determined by CSM TM scratch tester using scratch widths at low loads. The measured hardness values were compared with conventional nanoindentation hardness measurements using a CSM TM nanohardness tester. At these low indentation depths there is a good correlation between the scratch hardness and the nanoindentation hardness, with an increase in hardness as the film thickness decreases.
Comparison between Nanoindentation and Scratch Test Hardness (Scratch Hardness) Values of Copper Thin Films on Oxidised Silicon SubstratesView PDF of paper
ISBN:0-9767985-6-5
Pages:871
Hardcopy:$119.95
 
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