New reference standards and artifacts for nanoscale property characterization

	Nanotech 2006 Vol. 1 Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1 Chapter 8: Characterization
	New reference standards and artifacts for nanoscale property characterization
Authors:	J.R. Pratt, J.A. Kramar, G. Shaw, R. Gates, P. Rice and J. Moreland
Affilation:	National Institute of Standards and Technology, US
Pages:	764 - 767
Keywords:	atomic force microscope, cantilever, stiffness calibration
Abstract:	This paper provides an overview of calibration artifacts being developed at NIST that will greatly aid the accurate determination of nanoscale physical properties across a broad range of applications. We focus on three proposed reference standards: a spring constant artifact for calibration of atomic force microscope cantilever stiffness, a piezoresistive force sensor for calibration of contact force in atomic force acoustic microscopy, and a torsional oscillator for the absolute measurement of thin-film magnetic moments.
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ISBN:	0-9767985-6-5
Pages:	871
Hardcopy:	$119.95

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