Nano Science and Technology Institute
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 1
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
 
Chapter 8: Characterization
 

Laser Postionization Secondary Neutral Mass Spectrometry for Analysis on the Nanometer-Scale

Authors:I.V. Veryovkin, W.F. Calaway, C.E. Tripa and M.J. Pellin
Affilation:Argonne National Laboratory, US
Pages:733 - 736
Keywords:mass spectrometry, laser postionization, ion sputtering, laser desorption
Abstract:A new time-of-flight mass spectometer of postionized secondary neutrals, SARISA, has been developed and constructed at Argonne National Laboratory. This advanced analytical instrument has uniquely high useful yield >20%, is equipped with high spatial resolution microprobes (ion, electron and laser) that are combined with low energy ion sputtering for high depth resolution. This makes the instrument capable of three-dimensional characterization of samples with nanometer dimensions.
Laser Postionization Secondary Neutral Mass Spectrometry for Analysis on the Nanometer-ScaleView PDF of paper
ISBN:0-9767985-6-5
Pages:871
Hardcopy:$119.95
 
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