Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 1
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1

Coatings, Adhesives and Composites Chapter 3

Characterization of Aluminum Nitride Nanostructures by XANES and FTIR Spectroscopies with Synchrotron Radiation

Authors: S. Bellucci, C. Balasubramanian, G. Cinque, A. Marcelli, M. Cestelli Guidi, M. Piccinini, A. Popov, A. Soldatov and P. Onorato

Affilation: INFN-Laboratori Nazionali di Frascati, Italy

Pages: 233 - 238

Keywords: Fourier transform infrared spectroscopy, X-ray absorption near edge spectroscopy, nanowires, nanoparticles, aluminum nitride

Abstract:
We investigated nano-systems of AlN synthesized by DC arc-plasma-induced melting of aluminum in a nitrogen–argon ambient. Actually, the reaction of molten Al with N2 gas yields on a water-cooled surface a mixture of both nanowires and nanoparticles.<br>Experiments were performed at the Synchrotron Radiation facility of the INFN - Laboratori Nazionali di Frascati on AlN nano-systems using both Fourier Transform Infrared Spectroscopy (FTIR) and X-ray Absorption Near Edge Spectroscopy (XANES) in order to characterize these materials with both interesting tribological and electronic properties.<br>Comparison will be made between the information available from Infrared spectra, that probes the optical phonon modes mainly concerned with the molecular structure and the bonding energies of such nano-systems, and that available from X-ray absorption at the K-edge of Al that is connected to the local and empty density of states of this high-gap insulator. Comparison of the different local atomic structures around the Al site in AlN nanoparticles and nanotubes will be also discussed.


ISBN: 0-9767985-6-5
Pages: 871
Hardcopy: $119.95

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