Nano Science and Technology Institute
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 1
Technical Proceedings of the 2006 NSTI Nanotechnology Conference and Trade Show, Volume 1
 
Chapter 3: Coatings, Adhesives and Composites
 

Characterization of Aluminum Nitride Nanostructures by XANES and FTIR Spectroscopies with Synchrotron Radiation

Authors:S. Bellucci, C. Balasubramanian, G. Cinque, A. Marcelli, M. Cestelli Guidi, M. Piccinini, A. Popov, A. Soldatov and P. Onorato
Affilation:INFN-Laboratori Nazionali di Frascati, IT
Pages:233 - 238
Keywords:Fourier transform infrared spectroscopy, X-ray absorption near edge spectroscopy, nanowires, nanoparticles, aluminum nitride
Abstract:We investigated nano-systems of AlN synthesized by DC arc-plasma-induced melting of aluminum in a nitrogen–argon ambient. Actually, the reaction of molten Al with N2 gas yields on a water-cooled surface a mixture of both nanowires and nanoparticles.
Experiments were performed at the Synchrotron Radiation facility of the INFN - Laboratori Nazionali di Frascati on AlN nano-systems using both Fourier Transform Infrared Spectroscopy (FTIR) and X-ray Absorption Near Edge Spectroscopy (XANES) in order to characterize these materials with both interesting tribological and electronic properties.
Comparison will be made between the information available from Infrared spectra, that probes the optical phonon modes mainly concerned with the molecular structure and the bonding energies of such nano-systems, and that available from X-ray absorption at the K-edge of Al that is connected to the local and empty density of states of this high-gap insulator. Comparison of the different local atomic structures around the Al site in AlN nanoparticles and nanotubes will be also discussed.
Characterization of Aluminum Nitride Nanostructures by XANES and FTIR Spectroscopies with Synchrotron RadiationView PDF of paper
ISBN:0-9767985-6-5
Pages:871
Hardcopy:$119.95
 
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