Nanotech 2005 Vol. 3
Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3

Modules and Circuits Chapter 11

Fault Tolerant Quantum Computation with new Reversible Gate
D.P. Vasudevan, P.K. Lala and J.P. Parkerson
University of Arkansas, Fayetteville, US

Nano Scale Autonomous Error-Tolerant (AET) Cellular Network
J. Liu, R. Weerasekera, L-R Zheng and H. Tenhunen
Royal Institute of Technology (KTH), SE


ISBN: 0-9767985-2-2
Pages: 786
Hardcopy: $109.95