 | Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3
Chapter 10: Computational Methods, Numerics and Software Tools |
Long-Wavelength Approximation Theory of Light Reflection from Nanoscale Anisotropic Layered Media | |
| Authors: | P. Adamson |
| Affilation: | University of Tartu, EE |
| Pages: | 664 - 667 |
| Keywords: | nanoscale layered media, anisotropic nanofilms, reflection theory, optical diagnostics |
| Abstract: | Nanoscale anisotropic thin films and multilayers are of most interest in surface science and nanotechnology. A widespread way to probe nanometric layers is to employ optical reflection methods. But the use of exact equations to resolve the inverse problem; i.e., to determine the parameters of layered structures from reflection characteristics, is rather complicated. A purpose of this paper is to investigate the reflection characteristics in the long-wavelength limit for an n-layer system of ultrathin anisotropic dielectric films on isotropic homogeneous substrates. We show that the accuracy of the long-wavelength approximation for nanoscopic anisotropic multilayers is quite satisfactory: if the maximum value of thickness over wavelength comprises a few hundredths then the errors of approximate formulas do not exceed a few percent. The most useful feature of obtained approximate expressions is that they are simply invertible, allowing a direct calculation of the parameters of ultrathin layers. |
 | View PDF of paper |
| ISBN: | 0-9767985-2-2 |
| Pages: | 786 |
| Hardcopy: | $109.95 |
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