Authors: P. Adamson
Affilation: University of Tartu, Estonia
Pages: 664 - 667
Keywords: nanoscale layered media, anisotropic nanofilms, reflection theory, optical diagnostics
Nanoscale anisotropic thin films and multilayers are of most interest in surface science and nanotechnology. A widespread way to probe nanometric layers is to employ optical reflection methods. But the use of exact equations to resolve the inverse problem; i.e., to determine the parameters of layered structures from reflection characteristics, is rather complicated. A purpose of this paper is to investigate the reflection characteristics in the long-wavelength limit for an n-layer system of ultrathin anisotropic dielectric films on isotropic homogeneous substrates. We show that the accuracy of the long-wavelength approximation for nanoscopic anisotropic multilayers is quite satisfactory: if the maximum value of thickness over wavelength comprises a few hundredths then the errors of approximate formulas do not exceed a few percent. The most useful feature of obtained approximate expressions is that they are simply invertible, allowing a direct calculation of the parameters of ultrathin layers.