Nanotech 2005 Vol. 3
Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3

Computational Methods, Numerics and Software Tools Chapter 10

Modeling of the Cosmic Radiation-Induced Failure Mechanism in High Power Devices

Authors: W. Kaindl, G. Soelkner, H.-J. Schulze and G. Wachutka

Affilation: Institute for Physics of Electrotechnology, Germany

Pages: 632 - 635

Keywords: cosmic radiation, power device failure, streamer, modeling

Abstract:
In order to achieve a more robust design of semiconductor power devices with enhanced hardness against cosmic radiation we have been working on a physical model which is able to explain and to visualize the failure mechanism in a detailed and quantitative manner.

Modeling of the Cosmic Radiation-Induced Failure Mechanism in High Power Devices

ISBN: 0-9767985-2-2
Pages: 786
Hardcopy: $109.95