Kaindl W., Soelkner G., Schulze H.-J., Wachutka G.
Institute for Physics of Electrotechnology, DE
Keywords: cosmic radiation, modeling, power device failure, streamer
In order to achieve a more robust design of semiconductor power devices with enhanced hardness against cosmic radiation we have been working on a physical model which is able to explain and to visualize the failure mechanism in a detailed and quantitative manner.
Journal: TechConnect Briefs
Volume: 3, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3
Published: May 8, 2005
Pages: 632 - 635
Industry sectors: Advanced Materials & Manufacturing | Sensors, MEMS, Electronics
Topic: Informatics, Modeling & Simulation
ISBN: 0-9767985-2-2