Nano Science and Technology Institute
Nanotech 2005 Vol. 3
Nanotech 2005 Vol. 3
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 10: Computational Methods, Numerics and Software Tools
 

Modeling of the Cosmic Radiation-Induced Failure Mechanism in High Power Devices

Authors:W. Kaindl, G. Soelkner, H.-J. Schulze and G. Wachutka
Affilation:Institute for Physics of Electrotechnology, DE
Pages:632 - 635
Keywords:cosmic radiation, power device failure, streamer, modeling
Abstract:In order to achieve a more robust design of semiconductor power devices with enhanced hardness against cosmic radiation we have been working on a physical model which is able to explain and to visualize the failure mechanism in a detailed and quantitative manner.
Modeling of the Cosmic Radiation-Induced Failure Mechanism in High Power DevicesView PDF of paper
ISBN:0-9767985-2-2
Pages:786
Hardcopy:$109.95
 
Order:Mail/Fax Form
Up
© 2014 Nano Science and Technology Institute. All Rights Reserved.
Terms of Use | Privacy Policy | Contact Us | Site Map