Authors: W. Kaindl, G. Soelkner, H.-J. Schulze and G. Wachutka
Affilation: Institute for Physics of Electrotechnology, Germany
Pages: 632 - 635
Keywords: cosmic radiation, power device failure, streamer, modeling
In order to achieve a more robust design of semiconductor power devices with enhanced hardness against cosmic radiation we have been working on a physical model which is able to explain and to visualize the failure mechanism in a detailed and quantitative manner.