Modeling of the Cosmic Radiation-Induced Failure Mechanism in High Power Devices
Authors:
W. Kaindl, G. Soelkner, H.-J. Schulze and G. Wachutka
Affilation:
Institute for Physics of Electrotechnology, DE
Pages:
632 - 635
Keywords:
cosmic radiation, power device failure, streamer, modeling
Abstract:
In order to achieve a more robust design of semiconductor power devices with enhanced hardness against cosmic radiation we have been working on a physical model which is able to explain and to visualize the failure mechanism in a detailed and quantitative manner.
