Scaling Relation for the Size Dependence of Acoustic, Dielectronic and Photonic Behaviour of Nanosolid Silicon

	Nanotech 2005 Vol. 2 Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2 Chapter 8: Atomic and Mesoscale Modelling of Nanoscale Phenomena
	Scaling Relation for the Size Dependence of Acoustic, Dielectronic and Photonic Behaviour of Nanosolid Silicon
Authors:	C.Q. Sun, L.K. Pan and C.M. Li
Affilation:	School EEE, NTU, Singapore, SG
Pages:	554 - 556
Keywords:	nanostructures, photonics, electronics, dielectrics
Abstract:	Structural miniaturization provides us with a new freedom that is indeed fascinating. The new freedom of size not only allows us to tune the physical and chemical properties of a specimen by simply adjusting the shape and size but also enables us to gain information that is beyond the scope of conventional approaches. Here we show that a recent bond order-length-strength (BOLS) correlation could reconcile the size effect on nanosolid silicon with elucidation of information such as the single energy level of an isolated Si atom, the frequency of Si-Si dimer vibration, the upper limit of photoabsorption/emission, and dielectric suppression.
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ISBN:	0-9767985-1-4
Pages:	808
Hardcopy:	$109.95

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