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 | Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 8: Atomic and Mesoscale Modelling of Nanoscale Phenomena |
| | Scaling Relation for the Size Dependence of Acoustic, Dielectronic and Photonic Behaviour of Nanosolid Silicon | | Authors: | C.Q. Sun, L.K. Pan and C.M. Li | | Affilation: | School EEE, NTU, Singapore, SG | | Pages: | 554 - 556 | | Keywords: | nanostructures, photonics, electronics, dielectrics | | Abstract: | Structural miniaturization provides us with a new freedom that is indeed fascinating. The new freedom of size not only allows us to tune the physical and chemical properties of a specimen by simply adjusting the shape and size but also enables us to gain information that is beyond the scope of conventional approaches. Here we show that a recent bond order-length-strength (BOLS) correlation could reconcile the size effect on nanosolid silicon with elucidation of information such as the single energy level of an isolated Si atom, the frequency of Si-Si dimer vibration, the upper limit of photoabsorption/emission, and dielectric suppression. | | ISBN: | 0-9767985-1-4 |
| Pages: | 808 |
| Hardcopy: | $165.00 |
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