In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection

	Nanotech 2005 Vol. 2 Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2 Chapter 5: Surfaces and Films
	In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection
Authors:	C-L Wu, F-G Tseng and C-C Chieng
Affilation:	National Tsing Hua University, TW
Pages:	408 - 411
Keywords:	in-situ, AFM, growth, self assembly monolayer, lateral deflection
Abstract:	We set a model for analysis the AFM image, by cross analysis multiple channel, we can investigate more nano scale information on surafce property.
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ISBN:	0-9767985-1-4
Pages:	808
Hardcopy:	$109.95

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