Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Surfaces and Films Chapter 5

In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection

Authors: C-L Wu, F-G Tseng and C-C Chieng

Affilation: National Tsing Hua University, Taiwan

Pages: 408 - 411

Keywords: in-situ, AFM, growth, self assembly monolayer, lateral deflection

Abstract:
We set a model for analysis the AFM image, by cross analysis multiple channel, we can investigate more nano scale information on surafce property.


ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95

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