Nano Science and Technology Institute
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
 
Chapter 5: Surfaces and Films
 

In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection

Authors:C-L Wu, F-G Tseng and C-C Chieng
Affilation:National Tsing Hua University, TW
Pages:408 - 411
Keywords:in-situ, AFM, growth, self assembly monolayer, lateral deflection
Abstract:We set a model for analysis the AFM image, by cross analysis multiple channel, we can investigate more nano scale information on surafce property.
In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral DeflectionView PDF of paper
ISBN:0-9767985-1-4
Pages:808
Hardcopy:$109.95
 
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