Nano Science and Technology Institute
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
 
Chapter 5: Surfaces and Films
 

Optical Characterization of the Au Nanoparticle Monolayer on Silicon Wafer

Authors:D-S Wang, L. Chuang and C-W Lin
Affilation:National Taiwan University, TW
Pages:396 - 399
Keywords:self assembled monolayer, nanoparticle, ellipsometry
Abstract:In recent years, self-assembly technique has been widely used in fabricating Au nanoparticle layer. It has drawn a lot of attentions owing to its promising application in biosensing.However, to date there have been very few reports on its optical constants, and most of them are the results of multilayers. The study employs multiple-incident-angle ellipsometry to decide the n and k of Au nanoparticle monolayer with high accuracy. The refractive index and extinction coefficient, as expected, vary with the surface coverage of the Au nanoparticle, but slowly attain to constant values, which point, we suppose, is where the surface coverage saturates.
Optical Characterization of the Au Nanoparticle Monolayer on Silicon WaferView PDF of paper
ISBN:0-9767985-1-4
Pages:808
Hardcopy:$109.95
 
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