Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Surfaces and Films Chapter 5

Optical Characterization of the Au Nanoparticle Monolayer on Silicon Wafer

Authors: D-S Wang, L. Chuang and C-W Lin

Affilation: National Taiwan University, Taiwan

Pages: 396 - 399

Keywords: self assembled monolayer, nanoparticle, ellipsometry

Abstract:
In recent years, self-assembly technique has been widely used in fabricating Au nanoparticle layer. It has drawn a lot of attentions owing to its promising application in biosensing.However, to date there have been very few reports on its optical constants, and most of them are the results of multilayers. The study employs multiple-incident-angle ellipsometry to decide the n and k of Au nanoparticle monolayer with high accuracy. The refractive index and extinction coefficient, as expected, vary with the surface coverage of the Au nanoparticle, but slowly attain to constant values, which point, we suppose, is where the surface coverage saturates.

Optical Characterization of the Au Nanoparticle Monolayer on Silicon Wafer

ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95