Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Surfaces and Films Chapter 5

In-situ Quantitative Integrated Tribo-SPM Nano-Micro-Metrology

Authors: N. Gitis, A. Daugela and M. Vinogradov

Affilation: CETR, United States

Pages: 351 - 354

Keywords: nano, micro, spm, tribo, metrology

Abstract:
Quantitative nano-metrology tools have become a standard in semiconductor, data storage and other hi-tech industries where products are tested for thin-film properties. Though it is critical to characterize advanced thin films and coatings, today’s off-line nanoscale metrology tools can capture only limited number of parameters. A novel quantitative nano/micro-tribometer with both SPM and optical microscope imaging integrated into it has been developed to characterize numerous physical and mechanical properties of liquid and solid thin films and coatings, with in-situ monitoring their changes during micro and nano indentation, scratching, reciprocating, rotating and other tribology tests. Both the materials properties and surface topography can be assessed periodically during the tests. Various experiments on semiconductor wafers, MEMS, bio-tissues and other objects with thin films are presented and discussed in detail.


ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95

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