Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Nanotechnology: Novel Product Development Chapter 12

Virtual Probe Microscope

Authors: M. Heying, J. Oliver, S. Sundararajan, P. Shrotryia, Q. Zou and A. Sannier

Affilation: Iowa State University, United States

Pages: 753 - 756

Keywords: atomic force microscope, scanning probe microscope, simulation

Abstract:
Virtual Probe Microscope (VPM) is a tool that has been developed to train users on Atomic Force Microscope (AFM) operation. The benefits from training with VPM include: reduced cost of training and increased transfer of training. The graphical user interface of VPM is layed out similar to common commercial AFM software packages. Along with standard AFM controls, users are given an additional graphical 3D window to view the probe traversing across a surface. Users are also allowed to manipulate probe geometry variable to increase understanding of AFM operation. VPM will be used in a graduate level scanning probe microscopy class in the spring of 2005 at Iowa State University to supplement traditional lab and classroom instruction.

Virtual Probe Microscope

ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95