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 | Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 11: Characterization Tools and Microscopy |
| | High Resolution Mapping of Compositional Differences at Electrode Interfaces by Electric Force Microscopy | | Authors: | G.A. Edwards, J.D. Driskell, A.J. Bergren, R.J. Lipert and M.D. Porter | | Affilation: | Ames Laboratory - U.S. DOE, US | | Pages: | 722 - 725 | | Keywords: | electric force microscopy, monolayer, electrode surface | | Abstract: | Benzyl mercaptan-derived monolayers (X-C6H4-CH2-SH) with various substituents are interrogated on a smooth gold substrate by Electric Force Microscopy. Plots of phase shift vs. dc bias voltage are presented. The basis for the expected two-dimensional phase based image contrast is derived from these plots. The images show the EFM has sufficient contrast to function as a compositional mapping methodology for patterns of monomolecular films. The imaging mechanism is examined by utilizing simple parallel place capacitor models and compared to the resulting plots of phase shift vs. applied voltage. | | ISBN: | 0-9767985-1-4 |
| Pages: | 808 |
| Hardcopy: | $165.00 |
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