Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Characterization Tools and Microscopy Chapter 11

New Developments in Spectroscopic Ellipsometry for Nano Sciences

Authors: J.-P. Piel, A. Darragon and C. Defranoux

Affilation: SOPRA-SA, France

Pages: 698 - 702

Keywords: spectroscopic ellipsometry

Abstract:
Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface like interferometry nor reference materials or reference beam like in absorption spectroscopy (IRRAS): this is an absolute technique often called first principal technique.


ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95

2015 & Newer Proceedings

Nanotech Conference Proceedings are now published in the TechConnect Briefs

NSTI Online Community