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 | Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 11: Characterization Tools and Microscopy |
| | An Evaluation of a Scanning Mobility Particle Sizer with NIST-Traceable Particle Size Standards | | Authors: | J. Vasiliou | | Affilation: | Duke Scientific Corporation, US | | Pages: | 691 - 694 | | Keywords: | SMPS, DMA, NIST, particle, standards, size, measurement | | Abstract: | A scanning mobility particle sizer (TSI Model 3936) was evaluated using Duke Scientific NIST traceable particle size standards as well as NIST SRM’s. The importance of instrument setup, electrospray operation and sample preparation for polystyrene spheres are discussed as well as the results from 14 different size reference standards. Correlation between the SMPS system, electron microscopy, and dynamic light scatting methods are also shown. Results show that with proper operation, the SMPS results fall within the uncertainty of the NIST traceable sizes in the range that was evaluated --- 20 to 100 nm. | | ISBN: | 0-9767985-1-4 |
| Pages: | 808 |
| Hardcopy: | $165.00 |
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