Nano Science and Technology Institute
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
 
Chapter 11: Characterization Tools and Microscopy
 

An Evaluation of a Scanning Mobility Particle Sizer with NIST-Traceable Particle Size Standards

Authors:J. Vasiliou
Affilation:Duke Scientific Corporation, US
Pages:691 - 694
Keywords:SMPS, DMA, NIST, particle, standards, size, measurement
Abstract:A scanning mobility particle sizer (TSI Model 3936) was evaluated using Duke Scientific NIST traceable particle size standards as well as NIST SRM’s. The importance of instrument setup, electrospray operation and sample preparation for polystyrene spheres are discussed as well as the results from 14 different size reference standards. Correlation between the SMPS system, electron microscopy, and dynamic light scatting methods are also shown. Results show that with proper operation, the SMPS results fall within the uncertainty of the NIST traceable sizes in the range that was evaluated --- 20 to 100 nm.
An Evaluation of a Scanning Mobility Particle Sizer with NIST-Traceable Particle Size StandardsView PDF of paper
ISBN:0-9767985-1-4
Pages:808
Hardcopy:$109.95
 
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