 | Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 11: Characterization Tools and Microscopy |
Visualizing Nano-Electromechanics by Vector Piezoresponse Force Microscopy | |
| Authors: | B.J. Rodriguez, S. Jesse, A.P. Baddorf, S.V. Kalinin, A. Gruverman |
| Affilation: | Oak Ridge National Laboratory, US |
| Pages: | 667 - 670 |
| Keywords: | AFM, PFM, AFAM, piezoelectric force microscopy |
| Abstract: | This is a detailed examination of the electro-mechanical and elastic coupling that occurs in the scanning probe microscopy of electro-active materials. This research is useful to detecting, imaging and understanding the orientation of nanoscale electromechanical anisotropies in material. This method has been applied to piezo electric and ferro electric thin films as well as biological samples |
 | View PDF of paper |
| ISBN: | 0-9767985-1-4 |
| Pages: | 808 |
| Hardcopy: | $109.95 |
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