Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2

Characterization Tools and Microscopy Chapter 11

Mechanical Nonlinear Generation with Coupled Torsional Harmonic Cantilevers for Sensitive and Quantitative Atomic Force Microscopy Imaging of Material Characteristics
O. Sahin, C.F. Quate and O. Solgaard
Stanford University, US

Visualizing Nano-Electromechanics by Vector Piezoresponse Force Microscopy
B.J. Rodriguez, S. Jesse, A.P. Baddorf, S.V. Kalinin, A. Gruverman
Oak Ridge National Laboratory, US

Quantification of Properties for Ferroelectric Thin Films Using Piezo-response Force Microscopy
M.G. Cain, M.J. Lowe, A. Cuenat, M. Stewart and J. Blackburn
National Physical Laboratory, UK

Nonlinear Response in Nanoshear Modulation Force Microscopy: Fourier Analysis
G. Haugstad
University of Minnesota, US

Simultaneous Topography and RECognition Mapping with PicoTREC™: A Powerful New Technology That Can Be Used To Map Nanometer-Scale Molecular Binding Sites On A Variety Of Surfaces
W.T. Johnson, G. Kada, C. Stroh, H. Gruber, H. Wang, F. Kienberger, A. Ebner, S. Lindsay and P. Hinterdorfer
Molecular Imaging, Corp., US

Optimization of Nano-Machining with Focused IonBeams
L.A. Giannuzzi, P. Anzalone and D. Phifer
FEI Company, US

Advanced Particle Beam Technologies for Nano-Characterization and Fabrication
J.J.L. Mulders and J. Greiser
FEI Company, NL

An Evaluation of a Scanning Mobility Particle Sizer with NIST-Traceable Particle Size Standards
J. Vasiliou
Duke Scientific Corporation, US

Integrated Optical Profiler and AFM: a 3D Metrology System for Nanotechnology
M. Jobin, A. Du and R. Foschia
University of Applied Sciences, CH

New Developments in Spectroscopic Ellipsometry for Nano Sciences
J.-P. Piel, A. Darragon and C. Defranoux
SOPRA-SA, FR

Novel Ion Beam Tools for Nanofabrication
Q. Ji, X. Jianga, L. Jia, Y. Chena, B. van der Akker and K.-N. Leung
Lawrence Berkeley National Laboratory, US

MEMS/NEMS Dynamics Measurement Tool Using The Stroboscopic Principle
H-H Liao and Y-J Yang
National Taiwan University, TW

Comparative Study of Fabrication Patterns of a Ferroelectric Polymer P(VDF-TrFE) on Gold Thin Film and Gold Ball via Dip-pen Nanolithography
Q. Tang, S.Q. Shi, L.M. Zhou and C.H. Xu
The Hong Kong Polytechnic University, CN

Theoretical and Experimental Study of Synthetic MFM Tips
Y.H. Wu, G. Han and Y.K. Zheng
National University of Singapore, SG

Atomic Force Microscope as a Tool for Nanometer Scale Surface Patterning
S.V. Lemeshko, S.A. Saunin and V.A. Shevyakov
Nanotechnology Instruments Europe B.V., NL

High Resolution Mapping of Compositional Differences at Electrode Interfaces by Electric Force Microscopy
G.A. Edwards, J.D. Driskell, A.J. Bergren, R.J. Lipert and M.D. Porter
Ames Laboratory - U.S. DOE, US


ISBN: 0-9767985-1-4
Pages: 808
Hardcopy: $109.95