 | Nanotech 2005 Vol. 2
Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 11: Characterization Tools and Microscopy |
| - | Mechanical Nonlinear Generation with Coupled Torsional Harmonic Cantilevers for Sensitive and Quantitative Atomic Force Microscopy Imaging of Material Characteristics |
| | O. Sahin, C.F. Quate and O. Solgaard |
| | Stanford University, US |
| - | Visualizing Nano-Electromechanics by Vector Piezoresponse Force Microscopy |
| | B.J. Rodriguez, S. Jesse, A.P. Baddorf, S.V. Kalinin, A. Gruverman |
| | Oak Ridge National Laboratory, US |
| - | Quantification of Properties for Ferroelectric Thin Films Using Piezo-response Force Microscopy |
| | M.G. Cain, M.J. Lowe, A. Cuenat, M. Stewart and J. Blackburn |
| | National Physical Laboratory, UK |
| - | Nonlinear Response in Nanoshear Modulation Force Microscopy: Fourier Analysis |
| | G. Haugstad |
| | University of Minnesota, US |
| - | Simultaneous Topography and RECognition Mapping with PicoTREC™: A Powerful New Technology That Can Be Used To Map Nanometer-Scale Molecular Binding Sites On A Variety Of Surfaces |
| | W.T. Johnson, G. Kada, C. Stroh, H. Gruber, H. Wang, F. Kienberger, A. Ebner, S. Lindsay and P. Hinterdorfer |
| | Molecular Imaging, Corp., US |
| - | Optimization of Nano-Machining with Focused IonBeams |
| | L.A. Giannuzzi, P. Anzalone and D. Phifer |
| | FEI Company, US |
| - | Advanced Particle Beam Technologies for Nano-Characterization and Fabrication |
| | J.J.L. Mulders and J. Greiser |
| | FEI Company, NL |
| - | An Evaluation of a Scanning Mobility Particle Sizer with NIST-Traceable Particle Size Standards |
| | J. Vasiliou |
| | Duke Scientific Corporation, US |
| - | Integrated Optical Profiler and AFM: a 3D Metrology System for Nanotechnology |
| | M. Jobin, A. Du and R. Foschia |
| | University of Applied Sciences, CH |
| - | New Developments in Spectroscopic Ellipsometry for Nano Sciences |
| | J.-P. Piel, A. Darragon and C. Defranoux |
| | SOPRA-SA, FR |
| - | Novel Ion Beam Tools for Nanofabrication |
| | Q. Ji, X. Jianga, L. Jia, Y. Chena, B. van der Akker and K.-N. Leung |
| | Lawrence Berkeley National Laboratory, US |
| - | MEMS/NEMS Dynamics Measurement Tool Using The Stroboscopic Principle |
| | H-H Liao and Y-J Yang |
| | National Taiwan University, TW |
| - | Comparative Study of Fabrication Patterns of a Ferroelectric Polymer P(VDF-TrFE) on Gold Thin Film and Gold Ball via Dip-pen Nanolithography |
| | Q. Tang, S.Q. Shi, L.M. Zhou and C.H. Xu |
| | The Hong Kong Polytechnic University, CN |
| - | Theoretical and Experimental Study of Synthetic MFM Tips |
| | Y.H. Wu, G. Han and Y.K. Zheng |
| | National University of Singapore, SG |
| - | Atomic Force Microscope as a Tool for Nanometer Scale Surface Patterning |
| | S.V. Lemeshko, S.A. Saunin and V.A. Shevyakov |
| | Nanotechnology Instruments Europe B.V., NL |
| - | High Resolution Mapping of Compositional Differences at Electrode Interfaces by Electric Force Microscopy |
| | G.A. Edwards, J.D. Driskell, A.J. Bergren, R.J. Lipert and M.D. Porter |
| | Ames Laboratory - U.S. DOE, US |
| ISBN: | 0-9767985-1-4 |
| Pages: | 808 |
| Hardcopy: | $165.00 |
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