Investigation of Molecular Rearrangement by AFM Analysis of SAMs Annealing Process

	Nanotech 2005 Vol. 1 Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 1 Chapter 12: Nanostructured Fluids, Soft Materials, and Self Assembly
	Investigation of Molecular Rearrangement by AFM Analysis of SAMs Annealing Process
Authors:	C-L Wu, H-Y Hsieh, F-G Tseng and C-C Chieng
Affilation:	National Tsing Hua University, TW
Pages:	804 - 0
Keywords:	AFM, annealing, self-assembly monolayer
Abstract:	Self assembly monolayers (SAMs) are easily prepared nano-film, and have been widely applied to improve device surface properties and biomaterial conjugation on substrates. Among various steps, annealing is one of the general processes for the improvement of SAMs formation quality. However, there have been not many methods developed to investigate the effects of this parameter quantitatively. This paper proposes to quantitatively investigate the effects of annealing on SAMs by both contact angle and interaction force measurement by AFM. Results demonstrate the quality of nano-film would been greatly improved by annealing process, and the film properties are also functions of temperature. The results demonstrated molecular rearrangement under thermal factor.
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ISBN:	0-9767985-0-6
Pages:	844
Hardcopy:	$109.95

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