WCM 2005
WCM 2005
Technical Proceedings of the 2005 Workshop on Compact Modeling

WCM 2004 Invited Papers Chapter 3

Recent Enhancements of MOS Model 11

Authors: R. van Langevelde, A.J. Scholten and D.B.M. Klaassen

Affilation: Philips Research Laboratories, Netherlands

Pages: 223 - 228

Keywords: MOS Model 11, compact MOSFET modelling, surface potential, thermal noise, induced gate noise

Abstract:
MOS Model 11 (MM11) is a surface-potential-based compact MOSFET model, which was introduced in 2001 (level 1100). An update of MM11, level 1101, was introduced in 2002. At the moment a second update of MM11, level 1102, has been completed and is under test. It includes: i) an iterative solution of the surface potential; ii) an improved description of the velocity saturation yielding a better modelling of the transconductance in saturation; and iii) a better description of noise, especially the induced gate current noise. In this paper we describe these improvements and show the resulting improved modelling of transistor performance.


ISBN: 0-9767985-3-0
Pages: 412

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