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 | WCM 2005
Technical Proceedings of the 2005 Workshop on Compact Modeling
Chapter 2: Poster Papers |
| | Extraction of Mosfet Effective Channel Length and Width Based on the Transconductance-To-Current Ratio | | Authors: | A.I.A. Cunha, M.C. Schneider, C. Galup-Montoro, C.D.C. Caetano and M.B. Machado | | Affilation: | Federal University of Santa Catarina, BR | | Pages: | 135 - 138 | | Keywords: | extraction, effective channel length, transconductance-to-current ratio | | Abstract: | This paper presents a very simple methodology for determining the effective channel length and width, which is independent of the determination of the threshold voltage. The procedure is based on measurement of the transconductance-to-current ratio (gm/ID) characteristic of the MOSFET in the linear region, from weak to moderate inversion. For the extraction of both the effective channel length and width, the gm/ID characteristic is determined for several devices of different mask channel lengths and widths, respectively. | | ISBN: | 0-9767985-3-0 |
| Pages: | 412 |
| Hardcopy: | $120.00 |
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