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 | WCM 2005
Technical Proceedings of the 2005 Workshop on Compact Modeling
Chapter 1: Invited Papers |
| | Compact Modeling of Four-Terminal Junction Field-Effect Transistors | | Authors: | J. Liou | | Affilation: | University of Central Florida, US | | Pages: | 111 - 116 | | Keywords: | four-terminal junction field-effect transistors, modeling, JFET compact model | | Abstract: | This paper presents a physics -based compact model for a four terminal (independent top and bottom gates) junction field-effect transistor (JFET). The model describes the JFET’s dc and ac characteristics with a high degree of accuracy and continuity. Temperature effect is also accounted for, and the model is applicable for a wide range of operating temperatures. |  | View paper | | ISBN: | 0-9767985-3-0 |
| Pages: | 412 |
| Hardcopy: | $120.00 |
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