Nano Science and Technology Institute
Nanotech 2004 Vol. 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 4: Nano Devices and Systems
 

Defects and Fault Characterization in Quantum Cellular Automata

Authors:M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi
Affilation:Northeastern University, US
Pages:190 - 193
Keywords:quantum computing, nano systems and devices, defect characterization
Abstract:In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Different defect mechanisms for QCA active devices and interconnects are considered and the appropriate fault models at logic-level are investigated. Different implementations of QCA logic devices and interconnects are compared in term of defect tolerance and testability.
Defects and Fault Characterization in Quantum Cellular AutomataView PDF of paper
ISBN:0-9728422-9-2
Pages:561
Hardcopy:$79.95
 
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