Defects and Fault Characterization in Quantum Cellular Automata

	Nanotech 2004 Vol. 3 Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3 Chapter 4: Nano Devices and Systems
	Defects and Fault Characterization in Quantum Cellular Automata
Authors:	M. Baradaran Tahoori, M. Momenzadeh, J. Huang and F. Lombardi
Affilation:	Northeastern University, US
Pages:	190 - 193
Keywords:	quantum computing, nano systems and devices, defect characterization
Abstract:	In this paper, a detailed simulation-based characterization of QCA defects and study of their effects at logic-level are presented. Different defect mechanisms for QCA active devices and interconnects are considered and the appropriate fault models at logic-level are investigated. Different implementations of QCA logic devices and interconnects are compared in term of defect tolerance and testability.
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ISBN:	0-9728422-9-2
Pages:	561
Hardcopy:	$79.95

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