Authors: M.B. Tahoori and S. Mitra
Affilation: Northeastern University, United States
Pages: 57 - 60
Keywords: molecular electronics, test, diagnosis, BIST, defect-tolerance, fault-tolerance, self-repair
Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware.