Nano Science and Technology Institute
Nanotech 2004 Vol. 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3
 
Chapter 2: Nanoscale Electronics and Quantum Devices
 

Fault Detection and Diagnosis Techniques for Molecular Computing

Authors:M.B. Tahoori and S. Mitra
Affilation:Northeastern University, US
Pages:57 - 60
Keywords:molecular electronics, test, diagnosis, BIST, defect-tolerance, fault-tolerance, self-repair
Abstract:Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware.
Fault Detection and Diagnosis Techniques for Molecular ComputingView PDF of paper
ISBN:0-9728422-9-2
Pages:561
Hardcopy:$79.95
 
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