Fault Detection and Diagnosis Techniques for Molecular Computing

	Nanotech 2004 Vol. 3 Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3 Chapter 2: Nanoscale Electronics and Quantum Devices
	Fault Detection and Diagnosis Techniques for Molecular Computing
Authors:	M.B. Tahoori and S. Mitra
Affilation:	Northeastern University, US
Pages:	57 - 60
Keywords:	molecular electronics, test, diagnosis, BIST, defect-tolerance, fault-tolerance, self-repair
Abstract:	Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware.
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ISBN:	0-9728422-9-2
Pages:	561
Hardcopy:	$79.95

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