Nanotech 2004 Vol. 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3

Commercial Tools, Processes and Materials Chapter 11

Miniaturized High Speed Visualization Setup for the Diagnostics of Dynamical Processes in Microsystems
H. Brugger, C. Maier and E.P. Hofer
University of Ulm, DE

Atomic Holographic Optical Storage Nanotechnology
M.E. Thomas
Colossal Storage Corp., US

Cooling and Power Conversion using Nanometer Gaps
A. Tavkhelidze and I. Cox
Cool Chips plc, UK

Novel Approach to Circuit Board Testing
R.G. Wright, L.V. Kirkland, M. Zgol, D. Adebimpe, E. Keenan and R. Mulligan
GMA Industries, Inc., US

Anticipating the Public Backlash: Public Relations Lessons for Nanotechnology from the Biotechnology Experience
J.H. Matsuura
University of Dayton School of Law, US

Enabling Nanofabrication through Dip Pen Nanolithography™
R. Eby and J. Leckenby
NanoInk Inc, US

Nanocrystalline Mixed Metal Oxides Novel Oxygen Storage Materials
H. Sarkas, P.G. Murray, A. Fay and R.W. Brotzman_Jr.
Nanophase Technologies Corporation, US

Realizing Complex Microsystems: A Deterministic Parallel Assembly Approach
J. Randall, G. Hughes, A. Geisberger, K. Tsui, R. Saini, M. Ellis and G. Skidmore
Zyvex Corporation, US

A Novel X-ray Microtomography System with High Resolution and Throughput
Y. Wang, F. Duewer, S. Kamath, D. Scott and W. Yun
Xradia, Inc., US

Step and Repeat UV Imprint Process Technology for Wafer-Scale Nano-Manufacturing
M. Watts, V. Truskett, J. Choi, C. Mackay, I. McMackin, P. Schumaker, D. Babbs, S.V. Sreenivasan and N. Schumaker
Molecular Imprints, Inc, US

A New Semiconductor-Wafer Market Based on the Deepening of Surface Undulations to Form Strongly Textured Atomic Ridges (STAR) With Pitches from 0.6 to 5.4 nm: Model Demonstrations in Electronics and the Physical and Life Sciences
D.L. Kendall and M. Kendall
StarMega Corp, US

Leveraging Mainstream Design and Analysis Tools for MEMS
I. Mirman and D.C. Flanders
SolidWorks Corporation, US

UV Laser Micro-Materials Processing Of MEMS, Microfluidics, Sensors, LEDs and Other Miniature Devices
J.P. Sercel
JP Sercel Associates, Inc., US

Local Electrode Atom Probes for 3-D Metrology
T. Kelly, T. Gribb, J. Olson, R. Martens, J. Shepard, S. Wiener, T. Kunicki, R. Ulfig, D. Lenz, E. Strennen, E. Oltman, J. Bunton and D. Strait
Imago Scientific Instruments Corp., US

Nanoinformatics: Emerging Computational Tools in Nano-scale Research
K. Ruping and B.W. Sherman
Fellow, MIT, US

NANOPOLIS: An Infrastructure for Communication in the Nanotech World
D. Bog and F. Ciontu
iMediasoft Group, FR


ISBN: 0-9728422-9-2
Pages: 561
Hardcopy: $79.95