Nanotech 2004 Vol. 3
Nanotech 2004 Vol. 3
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 3

Nano Photonics, Optoelectronics and Imaging Chapter 1

An Ultra-Fast Scheme for Sample-Detection in Dynamic-Mode Atomic Force Microscopy

Authors: D.R. Sahoo, A. Sebastian and M.V. Salapaka

Affilation: Iowa State University, United States

Pages: 11 - 14

Keywords: atomic force microscopy, state-space model, state observer, hypothesis testing

Abstract:
In typical dynamic mode operation of atomic force microscopes steady state signals like amplitude and phase are used for detection and imaging of material. In these methods, high quality factor of the cantilever results in high resolution, but low bandwidth and vice versa. In this paper we present a methodology that exploits the deflection signal during the transients of the cantilever motion. The principle overcomes the fundamental limitations on the trade off between resolution and bandwidth present in existing methods and makes it independent of the quality factor. Experimental results provided corroborate the theoretical development.

An Ultra-Fast Scheme for Sample-Detection in Dynamic-Mode Atomic Force Microscopy

ISBN: 0-9728422-9-2
Pages: 561
Hardcopy: $79.95