Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 2
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 2

System Level Modeling Chapter 5

System-Level Optical Interface Modeling for Microsystems

Authors: T.P. Kurzweg, A.S Sharma, S.K. Bhat, S.P. Levitan, D.M. Chiarulli

Affilation: Drexel University, United States

Pages: 211 - 214

Keywords: angular spectrum, semi-vector, Fresnel coefficients, FDTD, system-level simulation

Abstract:
In this paper, we present an accurate and computationally efficient system-level optical propagation technique suitable for the modeling of optical interfaces. Our technique is based on extensions to the angular spectrum technique used to solve the Rayleigh-Sommerfeld formulation. By using a FFT, the angular spectrum technique is efficient and suitable for system-level modeling of the complete system. To support the reflection and transmission at optical interfaces, we implement a semi-vector technique, taking into account the polarization of the optical wavefront. The polarization is used to determine the reflection and transmission coefficients through the use of Berremans 4x4 matrix. Solutions are provided for typical TE and TM waves, however, wavefronts with arbitrary linear polarization are also supported. In this paper, we present a system-level simulation of a Silicon on Sapphire (SOS) interface.

System-Level Optical Interface Modeling for Microsystems

ISBN: 0-9728422-8-4
Pages: 519
Hardcopy: $79.95