 | Nanotech 2004 Vol. 2
Technical Proceedings of the 2004 NSTI Nanotechnology Conference and Trade Show, Volume 2
Chapter 2: Nano Scale Device Modeling |
Full-band Particle-based Simulation of Germanium-On-Insulator FETs | |
| Authors: | S. Beysserie, J. Branlard, S. Aboud, S.M. Goodnick, T. Thornton and M. Saraniti |
| Affilation: | Illinois Institute of Technology, US |
| Pages: | 25 - 28 |
| Keywords: | full-band simulation, SOI MOSFET, frequency analysis, Monte Carlo, device modeling, device simulation, MOSFET, germanium |
| Abstract: | We model and simulate novel fully depleted (FD) sub-50nm gate lengths MOSFET structures using a full-band particle simulator based on the Cellular Monte Carlo (CMC) method that provides an accurate transport model at the high electric fields present in these nanoscale devices. Simulations of Germanium- and Silicon-On-Insulator devices (GOI and SOI, respectively) are performed to quantitatively investigate the predicted increase of performance of GOI technology. A comparison of static and dynamic properties of similar GOI and SOI devices is performed for 50 nm and 35 nm gate lengths. |
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| ISBN: | 0-9728422-8-4 |
| Pages: | 519 |
| Hardcopy: | $79.95 |
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