Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 2
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2

System Level Modeling Chapter 11

Analysis and Verification of Processing Sequences
U. Hansen, U. Triltsch, S. Büttgenbach, C. Germer and H.J. Franke
Institute for Microtechnology, Braunschweig, DE

Lumped Modeling of Thermal Inkjet Print Head
Y-S Lee, M.S. Kim, S. Shin and S.J. Shin
CSE Center, Samsung Advanced Institute of Technology, KR

Model for Flow Resistance of a Rare Gas Accounting for Surface Roughness
T. Veijola
Helsinki University of Technology, FI

System Level Analysis for a Locomotive Inspection Robot with Integrated Microsystems
Y. Jeong, B. Kim, H. Oh and J-O Park
Korea Institute of Science & Technology, KR

System Model for MEMS based Laser Ultrasonic Receiver
W.C. Wilson
NASA Langley Research Center, US


ISBN: 0-9728422-1-7
Pages: 600