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 | Nanotech 2003 Vol. 2
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2
Chapter 1: Semiconductors |
| | An Energy Transport Gate Current Model Accounting for a Non-Maxwellian Energy Distribution | | Authors: | A. Gehring, T. Grasser, H. Kosina and S. Selberherr | | Affilation: | Institute for Microelectronics, Vienna, AT | | Pages: | 48 - 51 | | Keywords: | tunneling, simulation, non-Maxwellian | | Abstract: | We report on a new formulation for the description of hot electron tunneling through dielectrics. It is based on an expression which accounts for the non-Maxwellian shape of the electron energy distribution function (EED) and exactly reproduces its first three even moments n, Tn, and beta. Here we present a simplified model applicable within the framework of the energy-transport model which only provides n and Tn. Simulation results of long channel EEPROM devices and short channel MOSFETs are presented which show excellent agreement with Monte Carlo results and measurements. |  | View paper | | ISBN: | 0-9728422-1-7 |
| Pages: | 600 |
| Hardcopy: | $125.00 |
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