Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 2
Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2

Semiconductors Chapter 1

A Methodology of Field-Emission Modeling with Space-Charge Effects

Authors: T-H Tsai, H-K Tang and Y-J Yang

Affilation: National Taiwan University, Taiwan

Pages: 32 - 35

Keywords: space charge effect, field emission, BEM

Abstract:
In this paper, we present a methodology for modeling and simulating 3D field-emission devices (FED) with space-charge effect. This approach applies a boundary-element-method (BEM) electrostatics solver [1] and an adaptive explicit integrator. The space charge effect is modeled by a method similar to the particle-in-cell (PIC) method [2]. The results by this methodology are verified with the results by a commercial electromagnetic package MAGIC [3]. We also demonstrate that this methodology not only provides excellent accurate results, but also reduces the effort of creating 3D solid models of field emission tips.

A Methodology of Field-Emission Modeling with Space-Charge Effects

ISBN: 0-9728422-1-7
Pages: 600