A Methodology of Field-Emission Modeling with Space-Charge Effects

	Nanotech 2003 Vol. 2 Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2 Chapter 1: Semiconductors
	A Methodology of Field-Emission Modeling with Space-Charge Effects
Authors:	T-H Tsai, H-K Tang and Y-J Yang
Affilation:	National Taiwan University, TW
Pages:	32 - 35
Keywords:	space charge effect, field emission, BEM
Abstract:	In this paper, we present a methodology for modeling and simulating 3D field-emission devices (FED) with space-charge effect. This approach applies a boundary-element-method (BEM) electrostatics solver [1] and an adaptive explicit integrator. The space charge effect is modeled by a method similar to the particle-in-cell (PIC) method [2]. The results by this methodology are verified with the results by a commercial electromagnetic package MAGIC [3]. We also demonstrate that this methodology not only provides excellent accurate results, but also reduces the effort of creating 3D solid models of field emission tips.
	View PDF of paper
ISBN:	0-9728422-1-7
Pages:	600
Special:	3 CD Set — 15% off with Free Shipping
Up