Nano Science and Technology Institute - NSTI  
Nano Science and Technology Institute   Home | Subscribe | Site Map  
  ABOUT | COURSES | EVENTS | PUBLICATIONS | LEADERSHIP | OUTREACH | NEWS | PRESS | JOBS | Nanotechnology Solutions
px
px fade_top
Publications
Nanotech 2008 CDROM
Nanotech 2007 CDROM
Nanotech 2006 CDROM
Nanotech 2005 CDROM
Nanotech 2004 CDROM
3 CDROM Special Offer
Nanotech 2008 Vol. 1
Nanotech 2008 Vol. 2
Nanotech 2008 Vol. 3
Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 2
Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 4
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 2
Nanotech 2006 Vol. 3
Nanotech 2005 Vol. 1
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 3
WCM 2005
Nanotech 2004 Vol. 1
Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 3
Nanotech 2003 Vol. 1
Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 3
Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 2
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 2
MSM 2000
MSM 99
MSM 98
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
 
Publications Publications
MSM 99
p
 
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
MSM 99
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
 
Chapter 8: Numerics, Algorithims
 

Numeric Aspects of the Simulation of Two-Dimensional Ferroelectric Hysteresis

Authors:K. Dragosits and S. Selberherr
Affilation:TU Vienna, Austria
Pages:309 - 312
Keywords:hysteresis, ferroelectric materials, FEM-FET, nonvolatile memory
Abstract:Simulation of ferroelectric hysteresis allows the analysis of nonvolatile memory cells which are based on ferroelectric materials. We give an overview of our algorithm for the calculation of effects caused by field rotation. Implementation of this algorithm into a device simulator reveals interesting numerical aspects. One of these is that the locus curves of the hysteresis are non-symmetric, thus demanding a quite sophisticated sign handling to the fields and the uxes. Another change to common properties is the occurance of history information, which leads to an extension of the discretization. Also the iteration scheme has to be modified, in order to achieve convergence for nontrivial device structures. The abilities of our simulator are demonstrated by the simulation of a ferroelectric memory field effect transistor (FEMFET).
Numeric Aspects of the Simulation of Two-Dimensional Ferroelectric HysteresisView paper
ISBN:0-9666135-4-6
Pages:697
Hardcopy:$100.00
Special:3 CD Set — 15% off with Free Shipping
Up
Upcoming Events
Nanotech 2009
Cleantech 2009
BioNano 2009
TechConnect Summit
nanoPRwire™
nanoPRwire
News Headlines
nano World news
 
 
 
 
px
© Nano Science and Technology Institute     About NSTI | Terms of Use | Privacy Policy | Contact