Nano Science and Technology Institute - NSTI  
Nano Science and Technology Institute   Home | Subscribe | Site Map  
  ABOUT | COURSES | EVENTS | PUBLICATIONS | LEADERSHIP | OUTREACH | NEWS | PRESS | JOBS | Nanotechnology Solutions
px
px fade_top
Publications
Nanotech 2008 CDROM
Nanotech 2007 CDROM
Nanotech 2006 CDROM
Nanotech 2005 CDROM
Nanotech 2004 CDROM
3 CDROM Special Offer
Nanotech 2008 Vol. 1
Nanotech 2008 Vol. 2
Nanotech 2008 Vol. 3
Nanotech 2007 Vol. 1
Nanotech 2007 Vol. 2
Nanotech 2007 Vol. 3
Nanotech 2007 Vol. 4
Nanotech 2006 Vol. 1
Nanotech 2006 Vol. 2
Nanotech 2006 Vol. 3
Nanotech 2005 Vol. 1
Nanotech 2005 Vol. 2
Nanotech 2005 Vol. 3
WCM 2005
Nanotech 2004 Vol. 1
Nanotech 2004 Vol. 2
Nanotech 2004 Vol. 3
Nanotech 2003 Vol. 1
Nanotech 2003 Vol. 2
Nanotech 2003 Vol. 3
Nanotech 2002 Vol. 1
Nanotech 2002 Vol. 2
Nanotech 2001 Vol. 1
Nanotech 2001 Vol. 2
MSM 2000
MSM 99
MSM 98
Index of Authors
Index of Keywords
Index of Affiliations
Library Request Form
Shopping Cart
Order Form
 
Publications Publications
MSM 99
p
 
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
MSM 99
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
 
Chapter 8: Numerics, Algorithims
 

Intelligent Automatic Meshing of Multilayer CMOS Micromachined Structures for Finite Element Analysis

Authors:H. Lakdawala, B. Baidya, T. Mukherjee and G.K. Fedder
Affilation:Carnegie Mellon University, U.S.A.
Pages:297 - 300
Keywords:CMOS micromachined structures, finite element analyssis, automatic meshing, 3D canonical representation
Abstract:In this paper, we describe an automatic technique for meshing multilayer CMOS micromachined structure for Finite Element Analysis (FEA) from device layout. The technique is based on a 3D canonical representation of the different CMOS layers an dfeature recognition of plate masses, springs, beams and comb drives within the surface micromachined MEMS device. Manual meshing of devices for FEA is very tedious for multilayers structures as each layer must be separately meshaed and subsequently merged. FE modeling experts tend to use heuristics derived from past experience and knowledge of structural features to improve mesh quality. We present a technique that tries to replicat this appoach by detecting various MEMS features, and then meshing them based on an user-supplied rules file. This approach results in a FDEA mesh that is computationally more efficient than conventional automeshers that have no knowledge of the geometry. The resulting computation time is found to be an order of magnitude faster that uniform meshing, with less than 5% difference in accuracy.
ISBN:0-9666135-4-6
Pages:697
Hardcopy:$100.00
Special:3 CD Set — 15% off with Free Shipping
Up
Upcoming Events
Nanotech 2009
Cleantech 2009
BioNano 2009
TechConnect Summit
nanoPRwire™
nanoPRwire
News Headlines
nano World news
 
 
 
 
px
© Nano Science and Technology Institute     About NSTI | Terms of Use | Privacy Policy | Contact