Nano Science and Technology Institute
MSM 99
MSM 99
Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
 
Chapter 12: Semiconductor Device Modeling
 

Modelling High Built-In Electric Field Effects on Generation-Recombination Rates in Space-Charge Regions of pn a-Si:H Junctions

Authors:J. Furlan, Z. Gorup, F. Smole and M. Topic
Affilation:University of Ljublijana, SI
Pages:443 - 446
Keywords:amorphous silicon, tunnelling, GR model
Abstract:A theoretical model of lateral transport of charge carriers in pn a-Si:H junctions with high built-in electric fields is proposed in which the transport of carriers is treated in a similar way to capture-emission transitions in the SRH generation-recombination approach. In this way, the tunnelling rates from transport edges to traps are expressed by an enhanced capture cross-section which strongly affects capture and emission rates of electrons and holes. The tunnelling and thermal capture and emission of carriers to and from localized states determine the occupancy function in the mobility gap of a-Si:H. Generation recombination dynamics are then expresssed by virtue of occupancy function and the continuous distribution of states in the gap of a-Si:H.
Modelling High Built-In Electric Field Effects on Generation-Recombination Rates in Space-Charge Regions of pn a-Si:H JunctionsView PDF of paper
ISBN:0-9666135-4-6
Pages:697
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