Nano Science and Technology Institute
Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems
MSM 98
Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems

Chapter 7:

Discretization, Numerics, Computational Efficiency

-A Fast Integral Equation Technique for Analysis of Microflow Sensors Based on Drag Force Calculations
 N.R. Aluru and J.K. White
 Massachusetts Institute of Technology, U.S.A.
-Coupling of Length Scales and Atomistic Simulation of a MEMS Device
 R.E. Rudd and J.Q. Broughton
 SFA, Inc., U.S.A.
-Automated Solid Model Extraction for MEMS Visualization
 D.L. DeVoe, S.B. Green and J.M Jump
 University of Maryland, U.S.A.
-Energy-Based Solution Method for the Global Behavior of Diaphragms Under Pneumatic and Electrostatic Pressure
 O. Francais and I. Dufour
 LISiR-URA-CNRS, France
-A Mixed Rigid/Elastic Formulation for an Efficient Analysis of Electromechanical Systems
 D. Ramaswamy, N.R. Aluru and J.K. White
 Massachusetts Institute of Technology, U.S.A.
-Nodal Analysis for MEMS Design Using SUGAR v0.5
 N. Zhou, J.V. Clark and K.S.J. Pister
 UC-Berkeley, U.S.A.
-Implications of Finite Time Stepping for Transient Sensor Models
 M. Schubert and B. González
 Fachhochschule Regensburg, Germany
-Coupling of FEM Programs for Simulation of Complex Systems
 B. Krevet and W. Kaboth
 Forschungszentrum Karlsruhe, Germany
-Coupled Electro-Mechanical Simulation of Integrated Micro-Electro-Mechanical Systems
 H-P Lien, T.G. Wiegele, L. Bomholt and R. Ruhl
 Integrated Systems Engineering AG, Switzerland
-MEMS Design Optimization Using Coupled FEM and Electrical Circuit Simulation
 H. Krassow, M. Zabala, A. Götz and C. Cané
 Centro Nacional de Microelectronica, Spain
-A 3D Mesh Generation Method for the Simulation of Semiconductor Processes and Devices
 K. Lilja, V. Moroz and D. Wake
 Technology Modeling Associates, Inc., U.S.A.
-Dispersive Media in FDTD-Comparison of Recursive Convolution and Auxiliary Differential Equation Methods
 T.O. Körner and W. Fichtner
 ETH-EPFL, Switzerland
ISBN:0-96661-35-0-3
Pages:678
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