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MSM 98
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Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems
MSM 98
Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems

Chapter 7:

Discretization, Numerics, Computational Efficiency

-A Fast Integral Equation Technique for Analysis of Microflow Sensors Based on Drag Force Calculations
 N.R. Aluru and J.K. White
 Massachusetts Institute of Technology, U.S.A.
-Coupling of Length Scales and Atomistic Simulation of a MEMS Device
 R.E. Rudd and J.Q. Broughton
 SFA, Inc., U.S.A.
-Automated Solid Model Extraction for MEMS Visualization
 D.L. DeVoe, S.B. Green and J.M Jump
 University of Maryland, U.S.A.
-Energy-Based Solution Method for the Global Behavior of Diaphragms Under Pneumatic and Electrostatic Pressure
 O. Francais and I. Dufour
 LISiR-URA-CNRS, France
-A Mixed Rigid/Elastic Formulation for an Efficient Analysis of Electromechanical Systems
 D. Ramaswamy, N.R. Aluru and J.K. White
 Massachusetts Institute of Technology, U.S.A.
-Nodal Analysis for MEMS Design Using SUGAR v0.5
 N. Zhou, J.V. Clark and K.S.J. Pister
 UC-Berkeley, U.S.A.
-Implications of Finite Time Stepping for Transient Sensor Models
 M. Schubert and B. González
 Fachhochschule Regensburg, Germany
-Coupling of FEM Programs for Simulation of Complex Systems
 B. Krevet and W. Kaboth
 Forschungszentrum Karlsruhe, Germany
-Coupled Electro-Mechanical Simulation of Integrated Micro-Electro-Mechanical Systems
 H-P Lien, T.G. Wiegele, L. Bomholt and R. Ruhl
 Integrated Systems Engineering AG, Switzerland
-MEMS Design Optimization Using Coupled FEM and Electrical Circuit Simulation
 H. Krassow, M. Zabala, A. Götz and C. Cané
 Centro Nacional de Microelectronica, Spain
-A 3D Mesh Generation Method for the Simulation of Semiconductor Processes and Devices
 K. Lilja, V. Moroz and D. Wake
 Technology Modeling Associates, Inc., U.S.A.
-Dispersive Media in FDTD-Comparison of Recursive Convolution and Auxiliary Differential Equation Methods
 T.O. Körner and W. Fichtner
 ETH-EPFL, Switzerland
ISBN:0-96661-35-0-3
Pages:678
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