Characterization, Parameter Extraction, Calibration

	MSM 98 Technical Proceedings of the 1998 International Conference on Modeling and Simulation of Microsystems Chapter 5: Characterization, Parameter Extraction, Calibration
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-	Validation and Calibration of Electrothermal Device Models Using Infrared Laser Probing Techniques
	R. Thalhammer, C. Fürböck, N. Seliger, E. Gornik and G. Wachutka
	Technical University of Münich, Germany
-	Analysis and Characterization of Laterally Induced Electrostatic Repulsive Forces
	K.B. Lee and Y-H Cho
	Korea Advanced Institute of Science and Technology, Korea
-	Inductance Extraction by Means of the Monte Carlo Method
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ISBN:	0-96661-35-0-3
Pages:	678
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